Gaya APA
Dislis, C., Dick, J. H., Dear, I. D., Ambler, A. P.. (1995).
Test economics and design for testability : for electronic circuits and systems .
Inggris:
Ellis Horwood Limited.
Gaya Chicago
Dislis, C., Dick, J. H., Dear, I. D., Ambler, A. P..
Test economics and design for testability : for electronic circuits and systems.
Inggris:
Ellis Horwood Limited,
1995.
Text.
Gaya MLA
Dislis, C., Dick, J. H., Dear, I. D., Ambler, A. P..
Test economics and design for testability : for electronic circuits and systems.
Inggris:
Ellis Horwood Limited,
1995.
Text.
Gaya Turabian
Dislis, C., Dick, J. H., Dear, I. D., Ambler, A. P..
Test economics and design for testability : for electronic circuits and systems.
Inggris:
Ellis Horwood Limited,
1995.
Print.